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KMID : 0359819980270070985
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Journal of Korean Neurosurgical Society
1998 Volume.27 No. 7 p.985 ~ p.990
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Scalp Defect, Injuries of Skull and Brain Parenchyme Caused by High Voltage Electrical Burn - A Case Report -
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최진환/Jin Hwan Choi
김성민/심영보/장영철/박용기/최선길/Sung Min Kim/Young Bo Shim/Young Chul Chang/Yong Kee Park/Sun Kil Choi
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Abstract
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KEYWORD
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High voltage-electrical burn, Brain parenchymal injury, Brain biopsy, Split rib graft cranioplasty,
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FullTexts / Linksout information
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Listed journal information
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